Dilip Shah is honored with Woodington Award at Measurement Science Conference

Dilip Shah was honored by the Measurement Science Conference with the 2010 Woodington Award in Pasadena, California on March 25, 2010. This award is intended to honor those individuals who personify the highest level of professionalism and dedication to the metrology community. The Woodington Award, since its inception in 1978, has been an annual award under the aegis of the Measurement Science Conference. It is awarded by the Conference to recognize a member of the Measurement Community who represents the highest level of professionalism and dedication to the Metrology Profession. Candidates for the Woodington Award shall have exhibited noteworthy Professional achievement in the Metrology Profession.

Dilip is currently a Principal of E = mc3 Solutions, a consulting practice that provides training and consulting solutions in ISO9000/TS 16949, ISO17025, measurement and computer applications.
Dilip is the co-author of The Metrology Handbook published by the ASQ Quality Press and has contributed to the 2010 re-write of the CCT Primer by the Quality Council of Indiana. Dilip participated in the development of ASQ’s Certified Calibration Technician exam. Dilip participates actively in the measurement related issues through National Conference of Standards Laboratories International (NCSLI) and the west coast based Measurement Science Conference (MSC) where he presents sessions, papers and workshops. Dilip also is a member of Institute of Electrical and Electronic Engineers (IEEE).

Dilip is the recipient of MQD’s Highest Award, the 2005 Max J. Unis Award, and co-recipient of MSC’s 2003 Algie Lance Award for the Best Paper (Gage R. & R. versus ANOVA).
Dilip is a Member of the A2LA Board of Directors (2006-2012). Dilip is a Chief Technical Officer for Workplace Training Inc. which provides many on-line measurement-related training options to the industry. Dilip is also involved in Learning & Development Committee activities of NCSLI. Dilip is a frequent contributor to the ASQ Quality Progress magazine’s Measure for Measure column